Dew point measurements best practices in semiconductor dry gases and wafer testing

Chemical - gas bottles
Semiconductor fabrication

Semiconductor ultra-pure gas can get contaminated down the line, and even trace moisture can ruin a chip. Learn how to keep your ultra-pure gases truly dry in this 30-minute, free webinar. 

Ultra-pure gases are crucial in semiconductor manufacturing as even trace contaminants in gases can cause defects in microchips, leading to performance issues or complete failures. At the same time, the gas line environments are rarely ideal and often include several potential contamination points.

In this expert-led session, Product Manager Juhani Lehto shares proven best practices for avoiding moisture contamination with ultra-pure gases, and uses a chip prober as an example. 

 

Join this 30-minute webinar to learn: 

  • How to measure dew point accurately in ultra-dry conditions
  • Why is dew point better than RH or PPM in low humidity conditions
  • Temperature-induced frost point fluctuations from adsorption/desorption phenomena and how to address them
  • How to minimize contamination risks and avoid wasting expensive gases in setups
  • Best sensor choices for fast and reliable wafer testing

If you have already attended or registered for this webinar, please click here. Otherwise, please watch the recorded webinar by filling the form.

See our Privacy Policy for more details.
You can modify your preference settings or unsubscribe at any time here
Product Manager Juhani Lehto from Vaisala

Webinar speaker: Juhani Lehto

Juhani Lehto is the product manager in Vaisala for high-end products. He has over 15 years of experience in industrial measurements and sensor technology. He holds a Master of Science degree in Technology from the Aalto University of Espoo, Finland.

Semiconductor wafer and microelectronics fabrication is a demanding process with little room for mistakes. The industry depends on high-performing monitoring and measurement instrumentation for precise chemical compositions and atmospheric conditions.